•Transformed semiconductor wafer quality management by unifying NCR, MRB, and CAPA(8D) onto a single platform with automation — eliminated quality escapes, increased CAPA completion rates, and recovered 15+ engineering hours weekly previously lost to Excel tracker maintenance.
•Developing supervised machine learning models for detecting a critical reliability defect (electrical short), integrating it with SPC and interactive dashboards for rapid response.
•Developed a RAG-based chatbot using open-source LLMs (LLama) to interact with quality records (NCR, MRB, 8D, etc.), streamlining information retrieval and improving accessibility.
•Automated QA teams's 3 daily tasks (workflow) with custom-built web apps (Python, Flask, JavaScript, React) cutting manual work by 8+ engineering hrs/week.
•Engineering interactive Tableau dashboards that transformed KPI monitoring from manual reporting to real-time analytics, enabling data-driven decisions, and reclaiming 4 engineering hours weekly.
•Implementing unsupervised (clustering) anomaly detection on semiconductor manufacturing parametric data to identify outlier wafers.