• Developed backend in java for new Scan Plan for wafer, which optimizes time to scan wafer by grouping defects based on locations, imaging conditions,type of defects;boosted throughput by 40%
• Programmed multithreaded Results Application backend in java, allowing user to view the results of wafer Scan in interactive way by viewing results at various levels of granularity.
• Results Application also performed Auto Classification of Defects utilizing Naïve Bayes and Support Vector Machines, improving efficiency of system by 98%.
• Lead a team of 2 members, responsible for developing small features in short cycles, assigning tasks, tracking high priority bugs, performing code walkthroughs. Team was awarded team of the Month award.